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Microscopy (Oxford, England)|August 4, 2020
Phase detection limits in off-axis electron holography from pixelated detectors: gain variations, geometric distortion and failure of reference-hologram correctionMartin Hÿtch, Christophe GatelUltramicroscopy|October 19, 2015
Differential phase-contrast dark-field electron holography for strain mappingThibaud Denneulin, Florent Houdellier, Martin HÿtchNature|June 20, 2008
Nanoscale holographic interferometry for strain measurements in electronic devicesMartin Hÿtch, Florent Houdellier, Florian Hüe, et al.Physical Review Letters|June 4, 2008
Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopyFlorian Hüe, Martin Hÿtch, Hugo Bender, et al.Ultramicroscopy|December 2, 2015
Realization of a tilted reference wave for electron holography by means of a condenser biprismFalk Röder, Florent Houdellier, Thibaud Denneulin, et al.Ultramicroscopy|September 10, 2013
Dynamic scattering theory for dark-field electron holography of 3D strain fieldsAxel Lubk, Elsa Javon, Nikolay Cherkashin, et al.Micron (Oxford, England : 1993)|April 8, 2014
Determining the work function of a carbon-cone cold-field emitter by in situ electron holographyLudvig de Knoop, Florent Houdellier, Christophe Gatel, et al.Nature Communications|December 18, 2025
Mapping electric fields and observation of ferroelectric domain switching in hafnia-zirconia devices by electron holographyLeifeng Zhang, Christophe Gatel, Muhammad Hamid Raza, et al.Nano Letters|April 13, 2026
Leakage-Induced Space-Charge Accumulation and Interfacial Field Redistribution in a Dielectric Nanocapacitor Revealed by <i>Operando</i> Electron HolographyBérangère Disic, Kilian Gruel, Aurélien Masseboeuf, et al.Advanced Materials (Deerfield Beach, Fla.)|November 25, 2024
Quantification of Interfacial Charges in Multilayered Nanocapacitors by Operando Electron HolographyLeifeng Zhang, Muhammad Hamid Raza, Rong Wu, et al.Pageof 2