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Martin J Hÿtch

Showing results (1-10 of 10) with videos related to

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Scientific Reports|October 1, 2017
Electron microscopy by specimen design: application to strain measurementsNikolay Cherkashin, Thibaud Denneulin, Martin J Hÿtch
Nature|May 16, 2003
Measurement of the displacement field of dislocations to 0.03 A by electron microscopyMartin J Hÿtch, Jean-Luc Putaux, Jean-Michel Pénisson
Proceedings of the National Academy of Sciences of the United States of America|December 21, 2004
Nanoscale waviness of low-angle grain boundariesCraig L Johnson, Martin J Hÿtch, Peter R Buseck
Nano Letters|May 6, 2024
Measuring Electrical Resistivity at the Nanoscale in Phase-Change MaterialsLeifeng Zhang, Frédéric Lorut, Kilian Gruel, et al.
Ultramicroscopy|March 20, 2012
A new linear transfer theory and characterization method for image detectors. Part II: experimentAxel Lubk, Falk Röder, Tore Niermann, et al.
Physical Review Letters|February 3, 2004
Vortex flux channeling in magnetic nanoparticle chainsMartin J Hÿtch, Rafal E Dunin-Borkowski, Michael R Scheinfein, et al.
Nature Materials|December 18, 2007
Effects of elastic anisotropy on strain distributions in decahedral gold nanoparticlesCraig L Johnson, Etienne Snoeck, Manex Ezcurdia, et al.
Microscopy Research and Technique|November 19, 2004
Off-axis electron holography of magnetic nanowires and chains, rings, and planar arrays of magnetic nanoparticlesRafal E Dunin-Borkowski, Takeshi Kasama, Alexander Wei, et al.
Nanotechnology|June 15, 2017
Carrier transport and emission efficiency in InGaN quantum-dot based light-emitting diodesDaniele Barettin, Matthias Auf der Maur, Aldo di Carlo, et al.
Nanotechnology|November 30, 2016
Influence of electromechanical coupling on optical properties of InGaN quantum-dot based light-emitting diodesDaniele Barettin, Matthias Auf der Maur, Aldo di Carlo, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Scientific Reports|October 1, 2017
Electron microscopy by specimen design: application to strain measurementsNikolay Cherkashin, Thibaud Denneulin, Martin J Hÿtch
Nature|May 16, 2003
Measurement of the displacement field of dislocations to 0.03 A by electron microscopyMartin J Hÿtch, Jean-Luc Putaux, Jean-Michel Pénisson
Proceedings of the National Academy of Sciences of the United States of America|December 21, 2004
Nanoscale waviness of low-angle grain boundariesCraig L Johnson, Martin J Hÿtch, Peter R Buseck
Nano Letters|May 6, 2024
Measuring Electrical Resistivity at the Nanoscale in Phase-Change MaterialsLeifeng Zhang, Frédéric Lorut, Kilian Gruel, et al.
Ultramicroscopy|March 20, 2012
A new linear transfer theory and characterization method for image detectors. Part II: experimentAxel Lubk, Falk Röder, Tore Niermann, et al.
Physical Review Letters|February 3, 2004
Vortex flux channeling in magnetic nanoparticle chainsMartin J Hÿtch, Rafal E Dunin-Borkowski, Michael R Scheinfein, et al.
Nature Materials|December 18, 2007
Effects of elastic anisotropy on strain distributions in decahedral gold nanoparticlesCraig L Johnson, Etienne Snoeck, Manex Ezcurdia, et al.
Microscopy Research and Technique|November 19, 2004
Off-axis electron holography of magnetic nanowires and chains, rings, and planar arrays of magnetic nanoparticlesRafal E Dunin-Borkowski, Takeshi Kasama, Alexander Wei, et al.
Nanotechnology|June 15, 2017
Carrier transport and emission efficiency in InGaN quantum-dot based light-emitting diodesDaniele Barettin, Matthias Auf der Maur, Aldo di Carlo, et al.
Nanotechnology|November 30, 2016
Influence of electromechanical coupling on optical properties of InGaN quantum-dot based light-emitting diodesDaniele Barettin, Matthias Auf der Maur, Aldo di Carlo, et al.
Pageof 1