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Martin Kammler

Showing results (1-10 of 5) with videos related to

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Ultramicroscopy|September 7, 2012
Microstructural changes in silicon induced by patterning with focused ion beams of Ga, Si and AuSee Wee Chee, Martin Kammler, Prabhu Balasubramanian, et al.
Analytica Chimica Acta|May 26, 2026
SERS Substrate Enhancement Factor (SSEF) determination using Gas Chromatography-Mass spectrometry (GC-MS): A simplified approachValerius Abb, Tatjana Penn, Evgeny Melekhov, et al.
Scientific Reports|June 21, 2018
Directed Self-Assembly of Ge Quantum Dots Using Focused Si<sup>2+</sup> Ion Beam PatterningSee Wee Chee, Martin Kammler, Jeremy Graham, et al.
Physical Review Letters|December 11, 2012
Atomistic picture of charge density wave formation at surfacesSimone Wall, Boris Krenzer, Stefan Wippermann, et al.
Nature|March 21, 2003
Femtosecond X-ray measurement of coherent lattice vibrations near the Lindemann stability limitKlaus Sokolowski-Tinten, Christian Blome, Juris Blums, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|September 7, 2012
Microstructural changes in silicon induced by patterning with focused ion beams of Ga, Si and AuSee Wee Chee, Martin Kammler, Prabhu Balasubramanian, et al.
Analytica Chimica Acta|May 26, 2026
SERS Substrate Enhancement Factor (SSEF) determination using Gas Chromatography-Mass spectrometry (GC-MS): A simplified approachValerius Abb, Tatjana Penn, Evgeny Melekhov, et al.
Scientific Reports|June 21, 2018
Directed Self-Assembly of Ge Quantum Dots Using Focused Si<sup>2+</sup> Ion Beam PatterningSee Wee Chee, Martin Kammler, Jeremy Graham, et al.
Physical Review Letters|December 11, 2012
Atomistic picture of charge density wave formation at surfacesSimone Wall, Boris Krenzer, Stefan Wippermann, et al.
Nature|March 21, 2003
Femtosecond X-ray measurement of coherent lattice vibrations near the Lindemann stability limitKlaus Sokolowski-Tinten, Christian Blome, Juris Blums, et al.
Pageof 1