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Nanotechnology|May 8, 2009
Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratiosCharles A Clifford, Martin P SeahNanotechnology|April 4, 2012
Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issuesCharles A Clifford, Martin P SeahJournal of the American Society for Mass Spectrometry|April 24, 2016
Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass SpectrometryMartin P Seah, Rasmus Havelund, Ian S GilmoreRapid Communications in Mass Spectrometry : RCM|November 29, 2008
Cluster ion beam profiling of organics by secondary ion mass spectrometry--does sodium affect the molecular ion intensity at interfaces?Felicia M Green, Ian S Gilmore, Martin P SeahRapid Communications in Mass Spectrometry : RCM|January 23, 2009
G-SIMS: relative effectiveness of different monatomic primary ion source combinationsMartin P Seah, Ian S Gilmore, Felicia M GreenThe Journal of Physical Chemistry. B|September 10, 2013
Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ionsMartin P Seah, Steve J Spencer, Alex G ShardJournal of the American Society for Mass Spectrometry|December 8, 2009
Relationships between cluster secondary ion mass intensities generated by different cluster primary ionsMartin P Seah, Felicia M Green, Ian S GilmoreUltramicroscopy|February 24, 2012
Nanomechanical measurements of hair as an example of micro-fibre analysis using atomic force microscopy nanoindentationCharles A Clifford, Naoko Sano, Peter Doyle, et al.Journal of the American Society for Mass Spectrometry|June 11, 2014
Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organicsRasmus Havelund, Martin P Seah, Alexander G Shard, et al.Journal of the American Society for Mass Spectrometry|September 29, 2011
Topography and field effects in secondary ion mass spectrometry--part I: conducting samplesJoanna L S Lee, Ian S Gilmore, Martin P Seah, et al.Pageof 2