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Mary C Scott

Showing results (1-10 of 43) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 13, 2022
Understanding the Influence of Receptive Field and Network Complexity in Neural Network-Guided TEM Image AnalysisKatherine Sytwu, Catherine Groschner, Mary C Scott
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 8, 2022
Analysis of Interpretable Data Representations for 4D-STEM Using Unsupervised LearningAlexandra Bruefach, Colin Ophus, Mary C Scott
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 26, 2022
Chemical and Structural Alterations in the Amorphous Structure of Obsidian due to NanolitesEllis Kennedy, Bengisu Sari, Mary C Scott
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 6, 2021
Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy DataCatherine K Groschner, Christina Choi, Mary C Scott
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 29, 2024
Generalization Across Experimental Parameters in Neural Network Analysis of High-Resolution Transmission Electron Microscopy DatasetsKatherine Sytwu, Luis Rangel DaCosta, Mary C Scott
ACS Nano|February 9, 2024
Quantitative Mid-infrared Photoluminescence Characterization of Black Phosphorus-Arsenic AlloysShu Wang, Naoki Higashitarumizu, Bengisu Sari, et al.
ACS Nano|February 12, 2009
Dynamics within alkylsiloxane self-assembled monolayers studied by sensitive dielectric spectroscopyMary C Scott, Derrick R Stevens, Jason R Bochinski, et al.
ACS Nano|November 16, 2021
Simultaneous Successive Twinning Captured by Atomic Electron TomographyPhilipp M Pelz, Catherine Groschner, Alexandra Bruefach, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Relaxing Direct Ptychography Sampling Requirements via Parallax Imaging InsightsGeorgios Varnavides, Julie Marie Bekkevold, Stephanie M Ribet, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2021
A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction SimulationsPhilipp M Pelz, Alexander Rakowski, Luis Rangel DaCosta, et al.
Pageof 5

Showing results (1-10 of 43) with videos related to

Sort By:
Pageof 5
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 13, 2022
Understanding the Influence of Receptive Field and Network Complexity in Neural Network-Guided TEM Image AnalysisKatherine Sytwu, Catherine Groschner, Mary C Scott
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 8, 2022
Analysis of Interpretable Data Representations for 4D-STEM Using Unsupervised LearningAlexandra Bruefach, Colin Ophus, Mary C Scott
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 26, 2022
Chemical and Structural Alterations in the Amorphous Structure of Obsidian due to NanolitesEllis Kennedy, Bengisu Sari, Mary C Scott
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 6, 2021
Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy DataCatherine K Groschner, Christina Choi, Mary C Scott
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 29, 2024
Generalization Across Experimental Parameters in Neural Network Analysis of High-Resolution Transmission Electron Microscopy DatasetsKatherine Sytwu, Luis Rangel DaCosta, Mary C Scott
ACS Nano|February 9, 2024
Quantitative Mid-infrared Photoluminescence Characterization of Black Phosphorus-Arsenic AlloysShu Wang, Naoki Higashitarumizu, Bengisu Sari, et al.
ACS Nano|February 12, 2009
Dynamics within alkylsiloxane self-assembled monolayers studied by sensitive dielectric spectroscopyMary C Scott, Derrick R Stevens, Jason R Bochinski, et al.
ACS Nano|November 16, 2021
Simultaneous Successive Twinning Captured by Atomic Electron TomographyPhilipp M Pelz, Catherine Groschner, Alexandra Bruefach, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Relaxing Direct Ptychography Sampling Requirements via Parallax Imaging InsightsGeorgios Varnavides, Julie Marie Bekkevold, Stephanie M Ribet, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2021
A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction SimulationsPhilipp M Pelz, Alexander Rakowski, Luis Rangel DaCosta, et al.
Pageof 5