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Materials (Basel, Switzerland)|November 27, 2021
Correction: Kirste et al. Structural Analysis of Low Defect Ammonothermally Grown GaN Wafers by Borrmann Effect X-ray Topography. Materials 2021, 14, 5472Materials Editorial OfficeMaterials (Basel, Switzerland)|July 7, 2026
RETRACTED: Articles from the Special Issue "Effect of Hot Manufacturing Methods on Material Processing by Finite Element Modelling"Materials Editorial OfficePageof 1