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Matthias Posselt

Showing results (11-20 of 14) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 28, 2020
Comparison of Experimental STEM Conditions for Fluctuation Electron MicroscopyDražen Radić, Sven Hilke, Martin Peterlechner, et al.
Materials (Basel, Switzerland)|August 5, 2017
Ion-Beam-Induced Atomic Mixing in Ge, Si, and SiGe, Studied by Means of Isotope Multilayer StructuresManuel Radek, Bartosz Liedke, Bernd Schmidt, et al.
Advanced Materials (Deerfield Beach, Fla.)|October 11, 2021
Deterministic Shallow Dopant Implantation in Silicon with Detection Confidence Upper-Bound to 99.85% by Ion-Solid InteractionsAlexander M Jakob, Simon G Robson, Vivien Schmitt, et al.
Advanced Materials (Deerfield Beach, Fla.)|August 29, 2024
Scalable Atomic Arrays for Spin-Based Quantum Computers in SiliconAlexander M Jakob, Simon G Robson, Hannes R Firgau, et al.
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Showing results (11-20 of 14) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 14 results.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 28, 2020
Comparison of Experimental STEM Conditions for Fluctuation Electron MicroscopyDražen Radić, Sven Hilke, Martin Peterlechner, et al.
Materials (Basel, Switzerland)|August 5, 2017
Ion-Beam-Induced Atomic Mixing in Ge, Si, and SiGe, Studied by Means of Isotope Multilayer StructuresManuel Radek, Bartosz Liedke, Bernd Schmidt, et al.
Advanced Materials (Deerfield Beach, Fla.)|October 11, 2021
Deterministic Shallow Dopant Implantation in Silicon with Detection Confidence Upper-Bound to 99.85% by Ion-Solid InteractionsAlexander M Jakob, Simon G Robson, Vivien Schmitt, et al.
Advanced Materials (Deerfield Beach, Fla.)|August 29, 2024
Scalable Atomic Arrays for Spin-Based Quantum Computers in SiliconAlexander M Jakob, Simon G Robson, Hannes R Firgau, et al.
Pageof 2