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Matthias Temmen

Showing results (1-10 of 5) with videos related to

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Beilstein Journal of Nanotechnology|February 2, 2017
Noise in NC-AFM measurements with significant tip-sample interactionJannis Lübbe, Matthias Temmen, Philipp Rahe, et al.
Beilstein Journal of Nanotechnology|August 23, 2016
Understanding interferometry for micro-cantilever displacement detectionAlexander von Schmidsfeld, Tobias Nörenberg, Matthias Temmen, et al.
Beilstein Journal of Nanotechnology|April 26, 2013
Determining cantilever stiffness from thermal noiseJannis Lübbe, Matthias Temmen, Philipp Rahe, et al.
Beilstein Journal of Nanotechnology|February 13, 2013
Thermal noise limit for ultra-high vacuum noncontact atomic force microscopyJannis Lübbe, Matthias Temmen, Sebastian Rode, et al.
Sensors (Basel, Switzerland)|May 11, 2024
Improving Eye-Tracking Data Quality: A Framework for Reproducible Evaluation of Detection AlgorithmsChristopher Gundler, Matthias Temmen, Alessandro Gulberti, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Beilstein Journal of Nanotechnology|February 2, 2017
Noise in NC-AFM measurements with significant tip-sample interactionJannis Lübbe, Matthias Temmen, Philipp Rahe, et al.
Beilstein Journal of Nanotechnology|August 23, 2016
Understanding interferometry for micro-cantilever displacement detectionAlexander von Schmidsfeld, Tobias Nörenberg, Matthias Temmen, et al.
Beilstein Journal of Nanotechnology|April 26, 2013
Determining cantilever stiffness from thermal noiseJannis Lübbe, Matthias Temmen, Philipp Rahe, et al.
Beilstein Journal of Nanotechnology|February 13, 2013
Thermal noise limit for ultra-high vacuum noncontact atomic force microscopyJannis Lübbe, Matthias Temmen, Sebastian Rode, et al.
Sensors (Basel, Switzerland)|May 11, 2024
Improving Eye-Tracking Data Quality: A Framework for Reproducible Evaluation of Detection AlgorithmsChristopher Gundler, Matthias Temmen, Alessandro Gulberti, et al.
Pageof 1