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Max F Riedel

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Physical Review Letters|October 22, 2013
Quantum metrology with a scanning probe atom interferometerCaspar F Ockeloen, Roman Schmied, Max F Riedel, et al.
Nature|April 2, 2010
Atom-chip-based generation of entanglement for quantum metrologyMax F Riedel, Pascal Böhi, Yun Li, et al.
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Showing results (1-10 of 2) with videos related to

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Physical Review Letters|October 22, 2013
Quantum metrology with a scanning probe atom interferometerCaspar F Ockeloen, Roman Schmied, Max F Riedel, et al.
Nature|April 2, 2010
Atom-chip-based generation of entanglement for quantum metrologyMax F Riedel, Pascal Böhi, Yun Li, et al.
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