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Michael A Marciniak

Showing results (1-10 of 11) with videos related to

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Applied Optics|July 21, 2015
Effects of a measurement floor on Mueller matrix measurements in a dual rotating retarder polarimeter bidirectional scatter distribution function systemStephen E Nauyoks, Michael A Marciniak
Optics Express|February 12, 2014
Design considerations regarding ellipsoidal mirror based reflectometersMichael R Benson, Michael A Marciniak
Applied Optics|July 23, 2009
Path-averaged Cn2 estimation using a laser-and-corner-cube systemWalter P Cole, Michael A Marciniak
Optics Express|February 25, 2022
Utilization and efficient computation of polarization factor Q for fast, accurate BRDF modelingSamuel D Butler, And Michael A Marciniak
Optics Letters|June 2, 2015
Experimental analysis of bidirectional reflectance distribution function cross section conversion term in direction cosine spaceSamuel D Butler, Stephen E Nauyoks, Michael A Marciniak
Applied Optics|November 2, 2017
Three-dimensional imaging of trapped cold atoms with a light field microscopeGordon E Lott, Michael A Marciniak, John H Burke
Optics Express|November 23, 2021
Solar cell BRDF measurement and modeling with out-of-plane dataTodd V Small, Samuel D Butler, Michael A Marciniak
Optics Express|November 13, 2015
Comparison of microfacet BRDF model to modified Beckmann-Kirchhoff BRDF model for rough and smooth surfacesSamuel D Butler, Stephen E Nauyoks, Michael A Marciniak
The Review of Scientific Instruments|November 3, 2017
Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materialsJason C Vap, Stephen E Nauyoks, Michael R Benson, et al.
Optics Express|November 29, 2023
Active-illumination extension to the Priest and Meier pBRDFMark F Spencer, Milo W Hyde, Santasri R Bose-Pillai, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Applied Optics|July 21, 2015
Effects of a measurement floor on Mueller matrix measurements in a dual rotating retarder polarimeter bidirectional scatter distribution function systemStephen E Nauyoks, Michael A Marciniak
Optics Express|February 12, 2014
Design considerations regarding ellipsoidal mirror based reflectometersMichael R Benson, Michael A Marciniak
Applied Optics|July 23, 2009
Path-averaged Cn2 estimation using a laser-and-corner-cube systemWalter P Cole, Michael A Marciniak
Optics Express|February 25, 2022
Utilization and efficient computation of polarization factor Q for fast, accurate BRDF modelingSamuel D Butler, And Michael A Marciniak
Optics Letters|June 2, 2015
Experimental analysis of bidirectional reflectance distribution function cross section conversion term in direction cosine spaceSamuel D Butler, Stephen E Nauyoks, Michael A Marciniak
Applied Optics|November 2, 2017
Three-dimensional imaging of trapped cold atoms with a light field microscopeGordon E Lott, Michael A Marciniak, John H Burke
Optics Express|November 23, 2021
Solar cell BRDF measurement and modeling with out-of-plane dataTodd V Small, Samuel D Butler, Michael A Marciniak
Optics Express|November 13, 2015
Comparison of microfacet BRDF model to modified Beckmann-Kirchhoff BRDF model for rough and smooth surfacesSamuel D Butler, Stephen E Nauyoks, Michael A Marciniak
The Review of Scientific Instruments|November 3, 2017
Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materialsJason C Vap, Stephen E Nauyoks, Michael R Benson, et al.
Optics Express|November 29, 2023
Active-illumination extension to the Priest and Meier pBRDFMark F Spencer, Milo W Hyde, Santasri R Bose-Pillai, et al.
Pageof 2