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The Review of Scientific Instruments
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September 3, 2017
Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing
Michael G Ruppert, Yuen K Yong
The Review of Scientific Instruments
|
January 7, 2014
A novel self-sensing technique for tapping-mode atomic force microscopy
Michael G Ruppert, S O Reza Moheimani
Beilstein Journal of Nanotechnology
|
March 16, 2016
High-bandwidth multimode self-sensing in bimodal atomic force microscopy
Michael G Ruppert, S O Reza Moheimani
Beilstein Journal of Nanotechnology
|
March 23, 2017
Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement
Steven Ian Moore, Michael G Ruppert, Yuen Kuan Yong
Nanoscale
|
February 3, 2025
Low temperature multimode atomic force microscopy using an active MEMS cantilever
Michael G Ruppert, Miguel Wiche, André Schirmeisen, et al.
Beilstein Journal of Nanotechnology
|
January 25, 2020
A review of demodulation techniques for multifrequency atomic force microscopy
David M Harcombe, Michael G Ruppert, Andrew J Fleming
Beilstein Journal of Nanotechnology
|
March 9, 2018
Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy
David M Harcombe, Michael G Ruppert, Michael R P Ragazzon, et al.
Nano Letters
|
March 13, 2025
Modulated-Illumination Intermittent-Contact Tip-Enhanced Raman Spectroscopy
Michael G Ruppert, Ben S Routley, Luke R McCourt, et al.
Nanotechnology
|
September 26, 2018
Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing
Michael G Ruppert, Steven I Moore, Michal Zawierta, et al.
Beilstein Journal of Nanotechnology
|
September 14, 2017
A review of demodulation techniques for amplitude-modulation atomic force microscopy
Michael G Ruppert, David M Harcombe, Michael R P Ragazzon, et al.
Page
of 2
Search research articles
Search
Showing results (1-10 of 14) with videos related to
Sort By:
Page
of 2
The Review of Scientific Instruments
|
September 3, 2017
Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing
Michael G Ruppert, Yuen K Yong
The Review of Scientific Instruments
|
January 7, 2014
A novel self-sensing technique for tapping-mode atomic force microscopy
Michael G Ruppert, S O Reza Moheimani
Beilstein Journal of Nanotechnology
|
March 16, 2016
High-bandwidth multimode self-sensing in bimodal atomic force microscopy
Michael G Ruppert, S O Reza Moheimani
Beilstein Journal of Nanotechnology
|
March 23, 2017
Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement
Steven Ian Moore, Michael G Ruppert, Yuen Kuan Yong
Nanoscale
|
February 3, 2025
Low temperature multimode atomic force microscopy using an active MEMS cantilever
Michael G Ruppert, Miguel Wiche, André Schirmeisen, et al.
Beilstein Journal of Nanotechnology
|
January 25, 2020
A review of demodulation techniques for multifrequency atomic force microscopy
David M Harcombe, Michael G Ruppert, Andrew J Fleming
Beilstein Journal of Nanotechnology
|
March 9, 2018
Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy
David M Harcombe, Michael G Ruppert, Michael R P Ragazzon, et al.
Nano Letters
|
March 13, 2025
Modulated-Illumination Intermittent-Contact Tip-Enhanced Raman Spectroscopy
Michael G Ruppert, Ben S Routley, Luke R McCourt, et al.
Nanotechnology
|
September 26, 2018
Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing
Michael G Ruppert, Steven I Moore, Michal Zawierta, et al.
Beilstein Journal of Nanotechnology
|
September 14, 2017
A review of demodulation techniques for amplitude-modulation atomic force microscopy
Michael G Ruppert, David M Harcombe, Michael R P Ragazzon, et al.
Page
of 2