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Proceedings of Spie--The International Society for Optical Engineering|December 12, 2017
Update on Bio-Refining and Nanocellulose Composite Materials ManufacturingMichael T Postek, Dianne L PosterJournal of Visualized Experiments : Jove|October 22, 2019
Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic PaperMary Kombolias, Jan Obrzut, Michael T Postek, et al.Analytical Letters|March 3, 2020
Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper AgingMary Kombolias, Jan Obrzut, Michael T Postek, et al.Journal of Research of the National Institute of Standards and Technology|December 7, 2022
Broadband Dielectric Spectroscopy as a Potential Label-Free Method to Rapidly Verify Ultraviolet-C Radiation DisinfectionYaw S Obeng, Brian J Nablo, Darwin R Reyes, et al.Tappi Journal|April 16, 2019
Dielectric spectroscopic studies of biological material evolution and application to paperMary Kombolias, Jan Obrzut, Dianne L Poster, et al.Proceedings of Spie--The International Society for Optical Engineering|May 17, 2019
Innovative Approaches to Combat Healthcare-Associated Infections Using Efficacy Standards Developed Through Industry and Federal CollaborationDianne L Poster, C Cameron Miller, Yaw Obeng, et al.Radiation Physics and Chemistry (Oxford, England : 1993)|December 13, 2017
Ionizing radiation processing and its potential in advancing biorefining and nanocellulose composite materials manufacturingMichael T Postek, Dianne L Poster, András E Vládar, et al.Journal of Research of the National Institute of Standards and Technology|March 12, 2024
Ultraviolet Radiation Technologies and Healthcare-Associated Infections: Standards and Metrology NeedsDianne L Poster, C Cameron Miller, Richard A Martinello, et al.Journal of Research of the National Institute of Standards and Technology|March 12, 2024
Models for an Ultraviolet-C Research and Development ConsortiumDianne L Poster, Michael T Postek, Yaw S Obeng, et al.Journal of Research of the National Institute of Standards and Technology|February 8, 2024
Critical Issues in Scanning Electron Microscope MetrologyMichael T PostekPageof 5