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Ultramicroscopy|October 8, 2021
Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approachMichael Tkadletz, Alexandra Lechner, Silvia Pölzl, et al.
Materials (Basel, Switzerland)|September 9, 2023
On the Change in Hydrogen Diffusion and Trapping Behaviour of Pearlitic Rail Steel at Different Stages of ProductionMatthias Eichinger, Bernd Loder, Michael Tkadletz, et al.
Scientific Reports|November 28, 2024
Effective preparation of low-melting solder materials for atom probe tomographyCharlotte Cui, Michael Tkadletz, Michael Reisinger, et al.
Ultramicroscopy|January 7, 2023
Decomposition of CrN induced by laser-assisted atom probe tomographyHelene Waldl, Marcus Hans, Maximilian Schiester, et al.
Ultramicroscopy|December 31, 2022
Efficient preparation of microtip arrays for atom probe tomography using fs-laser processingMichael Tkadletz, Helene Waldl, Maximilian Schiester, et al.
Nanomaterials (Basel, Switzerland)|January 10, 2025
Reliable Atom Probe Tomography of Cu Nanoparticles Through Tailored Encapsulation by an Electrodeposited FilmAydan Çiçek, Florian Knabl, Maximilian Schiester, et al.
Ultramicroscopy|January 21, 2025
Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument studyMaximilian Schiester, Helene Waldl, Katherine P Rice, et al.
Ultramicroscopy|June 25, 2025
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of NSaeideh Naghdali, Maximilian Schiester, Helene Waldl, et al.
Scientific Reports|November 21, 2025
Sample preparation induced artefacts in soft SAC solders from uncooled and cooled Argon ion millingCharlotte Cui, Bernhard Sartory, Michael Tkadletz, et al.
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