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Michal Haindl

Showing results (1-10 of 5) with videos related to

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IEEE Transactions on Pattern Analysis and Machine Intelligence|April 27, 2021
Texture Segmentation BenchmarkStanislav Mikes, Michal Haindl
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 19, 2007
Extreme compression and modeling of bidirectional texture functionMichal Haindl, Jirí Filip
IEEE Transactions on Pattern Analysis and Machine Intelligence|September 19, 2009
Bidirectional texture function modeling: a state of the art surveyJirí Filip, Michal Haindl
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|May 19, 2009
Hierarchical multiple Markov chain model for unsupervised texture segmentationGiuseppe Scarpa, Raffaele Gaetano, Michal Haindl, et al.
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|February 21, 2009
Computer-aided evaluation of screening mammograms based on local texture modelsJirí Grim, Petr Somol, Michal Haindl, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Pattern Analysis and Machine Intelligence|April 27, 2021
Texture Segmentation BenchmarkStanislav Mikes, Michal Haindl
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 19, 2007
Extreme compression and modeling of bidirectional texture functionMichal Haindl, Jirí Filip
IEEE Transactions on Pattern Analysis and Machine Intelligence|September 19, 2009
Bidirectional texture function modeling: a state of the art surveyJirí Filip, Michal Haindl
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|May 19, 2009
Hierarchical multiple Markov chain model for unsupervised texture segmentationGiuseppe Scarpa, Raffaele Gaetano, Michal Haindl, et al.
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|February 21, 2009
Computer-aided evaluation of screening mammograms based on local texture modelsJirí Grim, Petr Somol, Michal Haindl, et al.
Pageof 1