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Mikhail E Ryskin

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The Journal of Physical Chemistry. B|March 29, 2007
Elemental analysis within the electrical double layer using total reflection X-ray fluorescence techniqueVladimir L Shapovalov, Mikhail E Ryskin, Oleg V Konovalov, et al.
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The Journal of Physical Chemistry. B|March 29, 2007
Elemental analysis within the electrical double layer using total reflection X-ray fluorescence techniqueVladimir L Shapovalov, Mikhail E Ryskin, Oleg V Konovalov, et al.
Pageof 1