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Journal of Electron Microscopy|May 14, 2003
A spherical aberration-corrected 200 kV TEMFumio Hosokawa, Takeshi Tomita, Mikio Naruse, et al.Microscopy Research and Technique|February 3, 2004
Nanoanalysis by a high-resolution energy filtering transmission electron microscopeMasanori Mitome, Yoshio Bando, Dmitri Golberg, et al.Journal of Electron Microscopy|June 24, 2005
Experimental evaluation of a spherical aberration-corrected TEM and STEMHidetaka Sawada, Takeshi Tomita, Mikio Naruse, et al.Pageof 1