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Chemelectrochem|February 19, 2019
Minimization of Catalyst Loading on Regenerative Fuel Cell Positive Electrodes Based on Titanium Felts using Atomic Layer DepositionStefanie Schlicht, Maïssa K S Barr, Mingjian Wu, et al.Nanotechnology|January 17, 2023
Influence of tin oxide decoration on the junction conductivity of silver nanowiresLilian Maria Vogl, Violetta Kalancha, Peter Schweizer, et al.Angewandte Chemie (International Ed. in English)|October 10, 2023
Synergistic Combination of Reductive Covalent Functionalization and Atomic Layer Deposition-Towards Spatially Defined Graphene-Organic-Inorganic HeterostructuresXin Liu, Bowen Yang, Xin Zhou, et al.Nanoscale Advances|September 22, 2022
Accessing local electron-beam induced temperature changes during in situ liquid-phase transmission electron microscopyBirk Fritsch, Andreas Hutzler, Mingjian Wu, et al.Physical Chemistry Chemical Physics : PCCP|January 6, 2025
Phase field simulations of thermal annealing for all-small molecule organic solar cellsYasin Ameslon, Olivier J J Ronsin, Christina Harreiß, et al.Small (Weinheim an Der Bergstrasse, Germany)|February 18, 2026
Laying the Foundation for Digital Material Design of Porous Transport Electrodes for PEM Water Electrolysis With Multiscale TomographyMarkus Bierling, David McLaughlin, Andreas Hutzler, et al.ACS Applied Materials & Interfaces|March 30, 2022
Exploring the Preparation Dependence of Crystalline 2D-Extended Ultrathin C8-BTBT-C8 FilmsTim Hawly, Manuel Johnson, Andreas Späth, et al.Nature Communications|February 7, 2026
Synthesis of 2D amorphous carbons via energy-autonomous carbonization of polyaniline upon decomposition of HClO₄Liu-Liu Shen, Gui-Rong Zhang, Weiwei Zhang, et al.ACS Nano|January 15, 2014
Combining atomistic simulation and X-ray diffraction for the characterization of nanostructures: a case study on fivefold twinned nanowiresFlorian Niekiel, Erik Bitzek, Erdmann SpieckerMicron (Oxford, England : 1993)|August 20, 2024
Characterization of extended defects in 2D materials using aperture-based dark-field STEM in SEMPeter Denninger, Peter Schweizer, Erdmann SpieckerPageof 18