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Ultramicroscopy|March 16, 2020
Source shot noise mitigation in focused ion beam microscopy by time-resolved measurementMinxu Peng, John Murray-Bruce, Karl K Berggren, et al.Arxiv|July 23, 2024
Shot noise-mitigated secondary electron imaging with ion count-aided microscopyAkshay Agarwal, Leila Kasaei, Xinglin He, et al.Proceedings of the National Academy of Sciences of the United States of America|July 25, 2024
Shot noise-mitigated secondary electron imaging with ion count-aided microscopyAkshay Agarwal, Leila Kasaei, Xinglin He, et al.Pageof 1