Showing results (1-10 of 42) with videos related to

Sort By:
Pageof 5
Micron (Oxford, England : 1993)|February 27, 2019
Toward 3D imaging of corrosion at the nanoscale: Cross-sectional analysis of in-situ oxidized TEM samplesWayne Harlow, Mitra L Taheri
Scientific Reports|October 1, 2021
RapidEELS: machine learning for denoising and classification in rapid acquisition electron energy loss spectroscopyCassandra M Pate, James L Hart, Mitra L Taheri
ACS Nanoscience Au|October 25, 2022
Termination-Property Coupling via Reversible Oxygen Functionalization of MXenesJames L Hart, Kanit Hantanasirisakul, Yury Gogotsi, et al.
Ultramicroscopy|July 1, 2014
Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale featuresMatthew I Hartshorne, Dieter Isheim, David N Seidman, et al.
Nanotechnology|June 16, 2012
Microstructural changes in CdSe-coated ZnO nanowires evaluated by in situ annealing in transmission electron microscopy and x-ray diffractionHasti Majidi, Christopher R Winkler, Mitra L Taheri, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Grain Boundary Plane Measurement Using Transmission Electron Microscopy Automated Crystallographic Orientation Mapping for Atom Probe Tomography SpecimensMatthew Hartshorne, Asher Leff, Gregory Vetterick, et al.
Plos One|February 6, 2025
FIRM image analysis: A machine learning workflow for quantifying extracellular matrix components from electron microscopy imagesNicholas T Gigliotti, Justin Lee, Emily H Mang, et al.
Proteins|August 11, 2017
Elucidation of insulin assembly at acidic and neutral pH: Characterization of low molecular weight oligomersMatthew T Mawhinney, Thomas L Williams, James L Hart, et al.
Micron (Oxford, England : 1993)|June 18, 2025
Low frequency band pass Fourier filtering for irradiation damage analysis in the transmission electron microscopeDaniel L Foley, Emily H Mang, Yongqiang Wang, et al.
Ultramicroscopy|July 10, 2023
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter DiffractionCaleb E Andrews, Maria Strantza, Nicholas P Calta, et al.
Pageof 5