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Microscopy (Oxford, England)
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March 5, 2026
Image simulation in projection-type electron microscopy for understanding experimental images under non-optimal conditions
Takeshi Morimoto, Momoyo Enyama, Akira Ikegami
Microscopy (Oxford, England)
|
January 11, 2023
Low-aberration ExB deflector optics for scanning electron microscopy
Momoyo Enyama, Ryuji Nishi, Hiroyuki Ito, et al.
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of 1
Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Microscopy (Oxford, England)
|
March 5, 2026
Image simulation in projection-type electron microscopy for understanding experimental images under non-optimal conditions
Takeshi Morimoto, Momoyo Enyama, Akira Ikegami
Microscopy (Oxford, England)
|
January 11, 2023
Low-aberration ExB deflector optics for scanning electron microscopy
Momoyo Enyama, Ryuji Nishi, Hiroyuki Ito, et al.
Page
of 1