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Sensors (Basel, Switzerland)|March 10, 2022
Multispectral Wavebands Selection for the Detection of Potential Foreign Materials in Fresh-Cut VegetablesSalma Sultana Tunny, Hanim Z Amanah, Mohammad Akbar Faqeerzada, et al.Frontiers in Plant Science|May 15, 2025
A systematic review of multi-mode analytics for enhanced plant stress evaluationAbdolrahim Zandi, Seyedali Hosseinirad, Hossein Kashani Zadeh, et al.Chemistry and Physics of Lipids|March 27, 2017
Continuous gradient temperature Raman spectroscopy and differential scanning calorimetry of N-3DPA and DHA from -100 to 10°CC Leigh Broadhurst, Walter F Schmidt, Julie K Nguyen, et al.Plant Disease|June 3, 2026
Canopy leaf-angle architecture and leaf blade-midrib susceptibility are associated with anthracnose severity in sorghum and johnsongrassEzekiel Ahn, Insuck Baek, Louis K Prom, et al.Foods (Basel, Switzerland)|August 28, 2025
Short-Wavelength Infrared Hyperspectral Imaging and Spectral Unmixing Techniques for Detection and Distribution of Pesticide Residues on Edible Perilla LeavesDennis Semyalo, Rahul Joshi, Yena Kim, et al.Sensors (Basel, Switzerland)|December 1, 2020
Classification of Watermelon Seeds Using Morphological Patterns of X-ray Imaging: A Comparison of Conventional Machine Learning and Deep LearningMohammed Raju Ahmed, Jannat Yasmin, Eunsung Park, et al.Meat Science|April 27, 2016
Chemical compositions, free amino acid contents and antioxidant activities of Hanwoo (Bos taurus coreanae) beef by cutMirae Oh, Eun-Kyung Kim, Byong-Tae Jeon, et al.Plos One|May 1, 2018
Calibration and testing of a Raman hyperspectral imaging system to reveal powdered food adulterationSantosh Lohumi, Hoonsoo Lee, Moon S Kim, et al.Frontiers in Plant Science|March 7, 2022
Estimation of Cold Stress, Plant Age, and Number of Leaves in Watermelon Plants Using Image AnalysisShona Nabwire, Collins Wakholi, Mohammad Akbar Faqeerzada, et al.Biomedical Optics Express|November 1, 2014
An average enumeration method of hyperspectral imaging data for quantitative evaluation of medical device surface contaminationHanh N D Le, Moon S Kim, Jeeseong Hwang, et al.Pageof 12