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Morgann Berg

Showing results (1-10 of 4) with videos related to

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Scientific Reports|February 2, 2018
Work Function Variations in Twisted Graphene LayersJeremy T Robinson, James Culbertson, Morgann Berg, et al.
The Review of Scientific Instruments|December 3, 2008
Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopySuenne Kim, Jeehoon Kim, Morgann Berg, et al.
ACS Applied Materials & Interfaces|March 13, 2018
Local Electronic Structure Changes in Polycrystalline CdTe with CdCl<sub>2</sub> Treatment and Air ExposureMorgann Berg, Jason M Kephart, Amit Munshi, et al.
ACS Nano|July 21, 2017
Experimental Determination of the Ionization Energies of MoSe<sub>2</sub>, WS<sub>2</sub>, and MoS<sub>2</sub> on SiO<sub>2</sub> Using Photoemission Electron MicroscopyKunttal Keyshar, Morgann Berg, Xiang Zhang, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Scientific Reports|February 2, 2018
Work Function Variations in Twisted Graphene LayersJeremy T Robinson, James Culbertson, Morgann Berg, et al.
The Review of Scientific Instruments|December 3, 2008
Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopySuenne Kim, Jeehoon Kim, Morgann Berg, et al.
ACS Applied Materials & Interfaces|March 13, 2018
Local Electronic Structure Changes in Polycrystalline CdTe with CdCl<sub>2</sub> Treatment and Air ExposureMorgann Berg, Jason M Kephart, Amit Munshi, et al.
ACS Nano|July 21, 2017
Experimental Determination of the Ionization Energies of MoSe<sub>2</sub>, WS<sub>2</sub>, and MoS<sub>2</sub> on SiO<sub>2</sub> Using Photoemission Electron MicroscopyKunttal Keyshar, Morgann Berg, Xiang Zhang, et al.
Pageof 1