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The Review of Scientific Instruments|June 3, 2016
Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctionsN Barrett, D M Gottlob, C Mathieu, et al.Journal of Physics. Condensed Matter : an Institute of Physics Journal|August 11, 2011
Spatially resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patternsN Barrett, L F Zagonel, O Renault, et al.Scientific Reports|September 14, 2018
Surface Proximity Effect, Imprint Memory of Ferroelectric Twins, and Tweed in the Paraelectric Phase of BaTiOC Mathieu, C Lubin, G Le Doueff, et al.Scientific Reports|December 19, 2018
Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memoriesM Kazar Mendes, E Martinez, J M Ablett, et al.Physical Review Letters|February 16, 2024
Ferroelastic Twin Angles at the Surface of CaTiO_{3} Quantified by Photoemission Electron MicroscopyG Magagnin, C Lubin, M Escher, et al.Journal of Physics. Condensed Matter : an Institute of Physics Journal|August 11, 2011
Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopyA Bailly, O Renault, N Barrett, et al.Journal of Physics. Condensed Matter : an Institute of Physics Journal|August 11, 2011
Orientation-dependent work function of in situ annealed strontium titanateL F Zagonel, M Bäurer, A Bailly, et al.Physical Review Letters|October 8, 2013
Polarization sensitive surface band structure of doped BaTiO3(001)J E Rault, J Dionot, C Mathieu, et al.Nano Letters|October 28, 2008
Direct quantification of gold along a single Si nanowireA Bailly, O Renault, N Barrett, et al.Scientific Reports|September 10, 2016
Low energy electron imaging of domains and domain walls in magnesium-doped lithium niobateG F Nataf, P Grysan, M Guennou, et al.Pageof 212