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Ultramicroscopy|August 16, 2016
In situ TEM Raman spectroscopy and laser-based materials modificationF I Allen, E Kim, N C Andresen, et al.
The Review of Scientific Instruments|September 3, 2017
A 5-μm pitch charge-coupled device optimized for resonant inelastic soft X-ray scatteringN C Andresen, P Denes, A Goldschmidt, et al.
Structural Dynamics (Melville, N.Y.)|December 7, 2023
Relativistic ultrafast electron diffraction at high repetition ratesK M Siddiqui, D B Durham, F Cropp, et al.
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