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Journal of Microscopy|June 5, 2001
Evanescent field excitation and measurement of dye fluorescence in a metallic probe near-field scanning optical microscopeN Hayazawa, Y Inouye, S KawataNanotechnology|October 25, 2012
Nanometric locking of the tight focus for optical microscopy and tip-enhanced microscopyN Hayazawa, K Furusawa, S KawataJournal of Microscopy|February 29, 2008
Stress imagining of semiconductor surface by tip-enhanced Raman spectroscopyY Saito, M Motohashi, N Hayazawa, et al.The Review of Scientific Instruments|December 11, 2023
Megahertz repetition rate-based lock-in detection scheme for rapid data acquisition in terahertz time domain spectroscopyM H Balgos, N Hayazawa, M Tani, et al.Nanotechnology|March 9, 2010
Nanoscale patterning induced strain redistribution in ultrathin strained Si layers on oxideO Moutanabbir, M Reiche, A Hähnel, et al.Pageof 1