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N Saowadee

Showing results (1-10 of 3) with videos related to

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Journal of Microscopy|May 16, 2012
Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconiaN Saowadee, K Agersted, J R Bowen
Journal of Microscopy|February 21, 2017
Lattice constant measurement from electron backscatter diffraction patternsN Saowadee, K Agersted, J R Bowen
Journal of Microscopy|November 7, 2012
Ion beam polishing for three-dimensional electron backscattered diffractionN Saowadee, K Agersted, H S Ubhi, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|May 16, 2012
Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconiaN Saowadee, K Agersted, J R Bowen
Journal of Microscopy|February 21, 2017
Lattice constant measurement from electron backscatter diffraction patternsN Saowadee, K Agersted, J R Bowen
Journal of Microscopy|November 7, 2012
Ion beam polishing for three-dimensional electron backscattered diffractionN Saowadee, K Agersted, H S Ubhi, et al.
Pageof 1