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Journal of X-Ray Science and Technology|April 8, 2017
Convolution-based scatter correction using kernels combining measurements and Monte Carlo simulationsNavnina Bhatia, David Tisseur, Jean Michel LétangJournal of X-Ray Science and Technology|October 8, 2016
Separable scatter model of the detector and object contributions using continuously thickness-adapted kernels in CBCTNavnina Bhatia, David Tisseur, Solene Valton, et al.Pageof 1