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Newbury

Showing results (131-140 of 934) with videos related to

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Scanning|August 14, 2012
Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative?Dale E Newbury, Nicholas W M Ritchie
Physical Review. A, Atomic, Molecular, and Optical Physics|July 1, 1993
Polarization-dependent frequency shifts from Rb-3He collisionsNewbury, Barton, Bogorad, et al.
Archives of Disease in Childhood|March 23, 2006
Appendiceal appearances: the great imitatorG Modgil, D I Cooke, L Newbury
Veterinary Dermatology|May 1, 2013
Five observations of a third morphologically distinct feline Demodex miteKaren A Moriello, Sandra Newbury, Howard Steinberg
BMJ (Clinical Research Ed.)|July 22, 1989
Hypophosphatemic rickets after ifosfamide treatmentR A Newbury-Ecob, P R Barbor
Journal of Personality Disorders|April 12, 2016
Offenders With Antisocial Personality Disorder Display More Impairments in MentalizingJohn Newbury-Helps, Janet Feigenbaum, Peter Fonagy
BMC Public Health|May 13, 2024
Bridging the gap between research evidence and its implementation in public health practice: case studies of embedded research modelAbisope Akintola, Dorothy Newbury-Birch, Stephanie Kilinc
MRS Advances|January 9, 2023
Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platformDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2016
Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive SpectrometryDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 15, 2015
Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-IIDale E Newbury, Nicholas W M Ritchie
Pageof 94

Showing results (131-140 of 934) with videos related to

Sort By:
Pageof 94
Scanning|August 14, 2012
Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative?Dale E Newbury, Nicholas W M Ritchie
Physical Review. A, Atomic, Molecular, and Optical Physics|July 1, 1993
Polarization-dependent frequency shifts from Rb-3He collisionsNewbury, Barton, Bogorad, et al.
Archives of Disease in Childhood|March 23, 2006
Appendiceal appearances: the great imitatorG Modgil, D I Cooke, L Newbury
Veterinary Dermatology|May 1, 2013
Five observations of a third morphologically distinct feline Demodex miteKaren A Moriello, Sandra Newbury, Howard Steinberg
BMJ (Clinical Research Ed.)|July 22, 1989
Hypophosphatemic rickets after ifosfamide treatmentR A Newbury-Ecob, P R Barbor
Journal of Personality Disorders|April 12, 2016
Offenders With Antisocial Personality Disorder Display More Impairments in MentalizingJohn Newbury-Helps, Janet Feigenbaum, Peter Fonagy
BMC Public Health|May 13, 2024
Bridging the gap between research evidence and its implementation in public health practice: case studies of embedded research modelAbisope Akintola, Dorothy Newbury-Birch, Stephanie Kilinc
MRS Advances|January 9, 2023
Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platformDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2016
Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive SpectrometryDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 15, 2015
Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-IIDale E Newbury, Nicholas W M Ritchie
Pageof 94