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Nicholas W M Ritchie

Showing results (11-20 of 27) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 2, 2022
Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited SpectraDale E Newbury, Nicholas W M Ritchie
Scanning|June 4, 2011
Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope?Dale E Newbury, Nicholas W M Ritchie
Journal of Materials Science|September 9, 2015
Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)Dale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2018
An Iterative Qualitative-Quantitative Sequential Analysis Strategy for Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry: Finding the Unexpected Needles in the Peak Overlap HaystackDale E Newbury, Nicholas W M Ritchie
MRS Advances|January 9, 2023
Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platformDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2016
Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive SpectrometryDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 15, 2015
Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-IIDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 24, 2019
Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional MappingDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 3, 2021
Quantitative Electron-Excited X-ray Microanalysis With Low-Energy L-shell X-ray Peaks Measured With Energy-Dispersive SpectrometryDale E Newbury, Nicholas W M Ritchie
Journal of Materials Science|October 30, 2024
Testing the accuracy of low-beam-energy electron-excited X-ray microanalysis with energy-dispersive spectrometryDale E Newbury, Nicholas W M Ritchie
Pageof 3

Showing results (11-20 of 27) with videos related to

Sort By:
Pageof 3
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 2, 2022
Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited SpectraDale E Newbury, Nicholas W M Ritchie
Scanning|June 4, 2011
Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope?Dale E Newbury, Nicholas W M Ritchie
Journal of Materials Science|September 9, 2015
Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)Dale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2018
An Iterative Qualitative-Quantitative Sequential Analysis Strategy for Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry: Finding the Unexpected Needles in the Peak Overlap HaystackDale E Newbury, Nicholas W M Ritchie
MRS Advances|January 9, 2023
Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platformDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2016
Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive SpectrometryDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 15, 2015
Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-IIDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 24, 2019
Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional MappingDale E Newbury, Nicholas W M Ritchie
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 3, 2021
Quantitative Electron-Excited X-ray Microanalysis With Low-Energy L-shell X-ray Peaks Measured With Energy-Dispersive SpectrometryDale E Newbury, Nicholas W M Ritchie
Journal of Materials Science|October 30, 2024
Testing the accuracy of low-beam-energy electron-excited X-ray microanalysis with energy-dispersive spectrometryDale E Newbury, Nicholas W M Ritchie
Pageof 3