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Surface and Interface Analysis : SIA
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February 12, 2013
Temperature Effects of Sputtering of Langmuir-Blodgett Multilayers
Dan Mao, Daniel A Brenes, Caiyan Lu, et al.
Analytical Chemistry
|
September 28, 2013
Depth profiling of metal overlayers on organic substrates with cluster SIMS
Kan Shen, Dan Mao, Barbara J Garrison, et al.
Analytical Chemistry
|
January 8, 2004
Laser desorption and imaging of proteins from ice via UV femtosecond laser pulses
Jamal I Berry, Shixin Sun, Yusheng Dou, et al.
Journal of the American Society for Mass Spectrometry
|
June 22, 2016
CO2 Cluster Ion Beam, an Alternative Projectile for Secondary Ion Mass Spectrometry
Hua Tian, Dawid Maciążek, Zbigniew Postawa, et al.
Analytical Chemistry
|
May 17, 2007
Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energy
Michael F Russo, Christopher Szakal, Joseph Kozole, et al.
Journal of Combinatorial Chemistry
|
January 10, 2006
Spectroscopically encoded resins for high throughput imaging time-of-flight secondary ion mass spectrometry
Sangki Chun, Jiyun Xu, Juan Cheng, et al.
Science (New York, N.Y.)
|
July 3, 2004
Mass spectrometric imaging of highly curved membranes during Tetrahymena mating
Sara G Ostrowski, Craig T Van Bell, Nicholas Winograd, et al.
Analytical Chemistry
|
March 24, 2017
Subcellular Chemical Imaging of Antibiotics in Single Bacteria Using C<sub>60</sub>-Secondary Ion Mass Spectrometry
Hua Tian, David A Six, Thomas Krucker, et al.
Analytical Chemistry
|
December 15, 2006
Surface and depth profiling investigation of a drug-loaded copolymer utilized to coat taxus express2 stents
Robert M Braun, Juan Cheng, Edward E Parsonage, et al.
Physical Review Letters
|
June 29, 2006
Surface sensitivity in cluster-ion-induced sputtering
Christopher Szakal, Joseph Kozole, Michael F Russo, et al.
Page
of 12
Search research articles
Search
Showing results (61-70 of 113) with videos related to
Sort By:
Page
of 12
Surface and Interface Analysis : SIA
|
February 12, 2013
Temperature Effects of Sputtering of Langmuir-Blodgett Multilayers
Dan Mao, Daniel A Brenes, Caiyan Lu, et al.
Analytical Chemistry
|
September 28, 2013
Depth profiling of metal overlayers on organic substrates with cluster SIMS
Kan Shen, Dan Mao, Barbara J Garrison, et al.
Analytical Chemistry
|
January 8, 2004
Laser desorption and imaging of proteins from ice via UV femtosecond laser pulses
Jamal I Berry, Shixin Sun, Yusheng Dou, et al.
Journal of the American Society for Mass Spectrometry
|
June 22, 2016
CO2 Cluster Ion Beam, an Alternative Projectile for Secondary Ion Mass Spectrometry
Hua Tian, Dawid Maciążek, Zbigniew Postawa, et al.
Analytical Chemistry
|
May 17, 2007
Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energy
Michael F Russo, Christopher Szakal, Joseph Kozole, et al.
Journal of Combinatorial Chemistry
|
January 10, 2006
Spectroscopically encoded resins for high throughput imaging time-of-flight secondary ion mass spectrometry
Sangki Chun, Jiyun Xu, Juan Cheng, et al.
Science (New York, N.Y.)
|
July 3, 2004
Mass spectrometric imaging of highly curved membranes during Tetrahymena mating
Sara G Ostrowski, Craig T Van Bell, Nicholas Winograd, et al.
Analytical Chemistry
|
March 24, 2017
Subcellular Chemical Imaging of Antibiotics in Single Bacteria Using C<sub>60</sub>-Secondary Ion Mass Spectrometry
Hua Tian, David A Six, Thomas Krucker, et al.
Analytical Chemistry
|
December 15, 2006
Surface and depth profiling investigation of a drug-loaded copolymer utilized to coat taxus express2 stents
Robert M Braun, Juan Cheng, Edward E Parsonage, et al.
Physical Review Letters
|
June 29, 2006
Surface sensitivity in cluster-ion-induced sputtering
Christopher Szakal, Joseph Kozole, Michael F Russo, et al.
Page
of 12