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O C Wells

Showing results (1-10 of 4) with videos related to

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The Review of Scientific Instruments|July 1, 1970
Collector turret for scanning electron microscopeO C Wells, C G Bremer
Scanning|October 6, 2001
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1--Applications to accurate dimension measurementsM T Postek, A E Vladár, O C Wells, et al.
Scanning|January 5, 2002
Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samplesO C Wells, M McGlashan-Powell, A E Vladár, et al.
Scanning|March 1, 2006
Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeO C Wells, L M Gignac, C E Murray, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|July 1, 1970
Collector turret for scanning electron microscopeO C Wells, C G Bremer
Scanning|October 6, 2001
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1--Applications to accurate dimension measurementsM T Postek, A E Vladár, O C Wells, et al.
Scanning|January 5, 2002
Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samplesO C Wells, M McGlashan-Powell, A E Vladár, et al.
Scanning|March 1, 2006
Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeO C Wells, L M Gignac, C E Murray, et al.
Pageof 1