O V Mayevska - JoVE Visualize

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Ultramicroscopy|June 20, 2006

Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potentialS F Lyuksyutov, P B Paramonov, O V Mayevska, et al.

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Ultramicroscopy|June 20, 2006

Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potentialS F Lyuksyutov, P B Paramonov, O V Mayevska, et al.

Pageof 1