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Omur E Dagdeviren

Showing results (1-10 of 19) with videos related to

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The Review of Scientific Instruments|July 10, 2021
Confronting interatomic force measurementsOmur E Dagdeviren
Nanotechnology|May 15, 2018
Exploring load, velocity, and surface disorder dependence of friction with one-dimensional and two-dimensional modelsOmur E Dagdeviren
The Review of Scientific Instruments|April 1, 2019
Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distanceOmur E Dagdeviren, Udo D Schwarz
Beilstein Journal of Nanotechnology|May 3, 2017
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysisOmur E Dagdeviren, Udo D Schwarz
The Review of Scientific Instruments|October 20, 2023
Customization of an atomic force microscope for multidimensional measurements under environmental conditionsBugrahan Guner, Simon Laflamme, Omur E Dagdeviren
The Journal of Physical Chemistry Letters|December 4, 2025
Standardizing Force Reconstruction in Dynamic Atomic Force MicroscopySimon Laflamme, Bugrahan Guner, Omur E Dagdeviren
Communications Materials|February 11, 2026
Insight into the Ehrlich-Schwoebel barrier via three-dimensional atomic force microscopy mapping of surface potentials on Au (111)Bugrahan Guner, Mehmet Z Baykara, Omur E Dagdeviren
The Review of Scientific Instruments|February 3, 2019
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensorsOmur E Dagdeviren, Yoichi Miyahara, Aaron Mascaro, et al.
Sensors (Basel, Switzerland)|October 20, 2019
Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe MicroscopyOmur E Dagdeviren, Yoichi Miyahara, Aaron Mascaro, et al.
Nanotechnology|November 8, 2016
Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphiteOmur E Dagdeviren, Jan Götzen, Eric I Altman, et al.
Pageof 2

Showing results (1-10 of 19) with videos related to

Sort By:
Pageof 2
The Review of Scientific Instruments|July 10, 2021
Confronting interatomic force measurementsOmur E Dagdeviren
Nanotechnology|May 15, 2018
Exploring load, velocity, and surface disorder dependence of friction with one-dimensional and two-dimensional modelsOmur E Dagdeviren
The Review of Scientific Instruments|April 1, 2019
Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distanceOmur E Dagdeviren, Udo D Schwarz
Beilstein Journal of Nanotechnology|May 3, 2017
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysisOmur E Dagdeviren, Udo D Schwarz
The Review of Scientific Instruments|October 20, 2023
Customization of an atomic force microscope for multidimensional measurements under environmental conditionsBugrahan Guner, Simon Laflamme, Omur E Dagdeviren
The Journal of Physical Chemistry Letters|December 4, 2025
Standardizing Force Reconstruction in Dynamic Atomic Force MicroscopySimon Laflamme, Bugrahan Guner, Omur E Dagdeviren
Communications Materials|February 11, 2026
Insight into the Ehrlich-Schwoebel barrier via three-dimensional atomic force microscopy mapping of surface potentials on Au (111)Bugrahan Guner, Mehmet Z Baykara, Omur E Dagdeviren
The Review of Scientific Instruments|February 3, 2019
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensorsOmur E Dagdeviren, Yoichi Miyahara, Aaron Mascaro, et al.
Sensors (Basel, Switzerland)|October 20, 2019
Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe MicroscopyOmur E Dagdeviren, Yoichi Miyahara, Aaron Mascaro, et al.
Nanotechnology|November 8, 2016
Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphiteOmur E Dagdeviren, Jan Götzen, Eric I Altman, et al.
Pageof 2