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Ultramicroscopy
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November 14, 2009
Is precession electron diffraction kinematical? Part I: "Phase-scrambling" multislice simulations
T A White, A S Eggeman, P A Midgley
Physical Review Letters
|
June 13, 2002
Quantitative electron holography of biased semiconductor devices
A C Twitchett, R E Dunin-Borkowski, P A Midgley
Ultramicroscopy
|
July 12, 2011
Extended ptychography in the transmission electron microscope: possibilities and limitations
F Hüe, J M Rodenburg, A M Maiden, et al.
Science (New York, N.Y.)
|
July 22, 2006
High-resolution three-dimensional imaging of dislocations
J S Barnard, J Sharp, J R Tong, et al.
Science (New York, N.Y.)
|
October 1, 2005
Embedded nanostructures revealed in three dimensions
I Arslan, T J V Yates, N D Browning, et al.
Ultramicroscopy
|
October 21, 2015
A novel 3D absorption correction method for quantitative EDX-STEM tomography
Pierre Burdet, Z Saghi, A N Filippin, et al.
Journal of Microscopy
|
January 26, 2010
Electron tomography of III-V quantum dots using dark field 002 imaging conditions
R Beanland, A M Sánchez, J C Hernandez-Garrido, et al.
Ultramicroscopy
|
November 27, 2007
TEM characterization of Ge precipitates in an Al-1.6at% Ge alloy
K Kaneko, K Inoke, K Sato, et al.
Journal of Microscopy
|
February 7, 2009
Quantitative off-axis electron holography of GaAs p-n junctions prepared by focused ion beam milling
D Cooper, R Truche, A C Twitchett-Harrison, et al.
Nanoscale
|
March 28, 2017
Gold and iodine diffusion in large area perovskite solar cells under illumination
S Cacovich, L Ciná, F Matteocci, et al.
Page
of 4
Search research articles
Search
Showing results (11-20 of 34) with videos related to
Sort By:
Page
of 4
Ultramicroscopy
|
November 14, 2009
Is precession electron diffraction kinematical? Part I: "Phase-scrambling" multislice simulations
T A White, A S Eggeman, P A Midgley
Physical Review Letters
|
June 13, 2002
Quantitative electron holography of biased semiconductor devices
A C Twitchett, R E Dunin-Borkowski, P A Midgley
Ultramicroscopy
|
July 12, 2011
Extended ptychography in the transmission electron microscope: possibilities and limitations
F Hüe, J M Rodenburg, A M Maiden, et al.
Science (New York, N.Y.)
|
July 22, 2006
High-resolution three-dimensional imaging of dislocations
J S Barnard, J Sharp, J R Tong, et al.
Science (New York, N.Y.)
|
October 1, 2005
Embedded nanostructures revealed in three dimensions
I Arslan, T J V Yates, N D Browning, et al.
Ultramicroscopy
|
October 21, 2015
A novel 3D absorption correction method for quantitative EDX-STEM tomography
Pierre Burdet, Z Saghi, A N Filippin, et al.
Journal of Microscopy
|
January 26, 2010
Electron tomography of III-V quantum dots using dark field 002 imaging conditions
R Beanland, A M Sánchez, J C Hernandez-Garrido, et al.
Ultramicroscopy
|
November 27, 2007
TEM characterization of Ge precipitates in an Al-1.6at% Ge alloy
K Kaneko, K Inoke, K Sato, et al.
Journal of Microscopy
|
February 7, 2009
Quantitative off-axis electron holography of GaAs p-n junctions prepared by focused ion beam milling
D Cooper, R Truche, A C Twitchett-Harrison, et al.
Nanoscale
|
March 28, 2017
Gold and iodine diffusion in large area perovskite solar cells under illumination
S Cacovich, L Ciná, F Matteocci, et al.
Page
of 4