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P A Thiel

Showing results (21-30 of 25) with videos related to

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Science (New York, N.Y.)|August 27, 2005
High frictional anisotropy of periodic and aperiodic directions on a quasicrystal surfaceJeong Young Park, D F Ogletree, M Salmeron, et al.
Physical Review Letters|October 26, 2005
Quantum size effects in metal thin films grown on quasicrystalline substratesV Fournée, H R Sharma, M Shimoda, et al.
The Journal of Physical Chemistry Letters|September 9, 2020
High Layer Uniformity of Two-Dimensional Materials Demonstrated Surprisingly from Broad Features in Surface Electron DiffractionS Chen, M Horn von Hoegen, P A Thiel, et al.
Physical Review Letters|October 4, 2012
High island densities and long range repulsive interactions: Fe on epitaxial grapheneS M Binz, M Hupalo, Xiaojie Liu, et al.
Physical Review Letters|October 4, 2005
Sensing dipole fields at atomic steps with combined scanning tunneling and force microscopyJeong Young Park, G M Sacha, M Enachescu, et al.
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Showing results (21-30 of 25) with videos related to

Sort By:
Pageof 3
You have reached the last page of results.This site can display upto 25 results.
Science (New York, N.Y.)|August 27, 2005
High frictional anisotropy of periodic and aperiodic directions on a quasicrystal surfaceJeong Young Park, D F Ogletree, M Salmeron, et al.
Physical Review Letters|October 26, 2005
Quantum size effects in metal thin films grown on quasicrystalline substratesV Fournée, H R Sharma, M Shimoda, et al.
The Journal of Physical Chemistry Letters|September 9, 2020
High Layer Uniformity of Two-Dimensional Materials Demonstrated Surprisingly from Broad Features in Surface Electron DiffractionS Chen, M Horn von Hoegen, P A Thiel, et al.
Physical Review Letters|October 4, 2012
High island densities and long range repulsive interactions: Fe on epitaxial grapheneS M Binz, M Hupalo, Xiaojie Liu, et al.
Physical Review Letters|October 4, 2005
Sensing dipole fields at atomic steps with combined scanning tunneling and force microscopyJeong Young Park, G M Sacha, M Enachescu, et al.
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