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Applied Optics|December 4, 2010
Thin-film designs by simulated annealingT Boudet, P Chaton, L Herault, et al.
Applied Optics|November 25, 2010
Infrared ellipsometry investigation of SiO(x)N(y) thin films on siliconA Brunet-Bruneau, G Vuye, J M Frigerio, et al.
Biosensors & Bioelectronics|March 31, 2005
Multiple wavelength fluorescence enhancement on glass substrates for biochip and cell analysesB Fouqué, B Schaack, P Obeïd, et al.
Applied Optics|December 4, 2010
Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurementsV Nguyen Van, A Brunet-Bruneau, S Fisson, et al.
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