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Ultramicroscopy
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July 28, 2006
Characterizing probe performance in the aberration corrected STEM
P E Batson
Ultramicroscopy
|
July 23, 2003
Aberration correction results in the IBM STEM instrument
P E Batson
Ultramicroscopy
|
January 1, 1978
The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
J N Chapman, P E Batson, E M Waddell, et al.
Ultramicroscopy
|
June 26, 2012
Nanoparticle movement: plasmonic forces and physical constraints
P E Batson, A Reyes-Coronado, R G Barrera, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
July 28, 2006
Characterizing probe performance in the aberration corrected STEM
P E Batson
Ultramicroscopy
|
July 23, 2003
Aberration correction results in the IBM STEM instrument
P E Batson
Ultramicroscopy
|
January 1, 1978
The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
J N Chapman, P E Batson, E M Waddell, et al.
Ultramicroscopy
|
June 26, 2012
Nanoparticle movement: plasmonic forces and physical constraints
P E Batson, A Reyes-Coronado, R G Barrera, et al.
Page
of 1