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Ultramicroscopy|August 23, 2019
On the residual six-fold astigmatism in DCOR/ASCORP Hartel, V Gerheim, M Linck, et al.
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Current and future aberration correctors for the improvement of resolution in electron microscopyM Haider, P Hartel, H Müller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2010
Information transfer in a TEM corrected for spherical and chromatic aberrationM Haider, P Hartel, H Müller, et al.
Ultramicroscopy|December 7, 2007
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEMM Haider, H Müller, S Uhlemann, et al.
Ultramicroscopy|August 2, 2011
Transmission electron microscopy at 20 kV for imaging and spectroscopyU Kaiser, J Biskupek, J C Meyer, et al.
Zentralblatt Fur Hygiene Und Umweltmedizin = International Journal of Hygiene and Environmental Medicine|December 1, 1989
Stabilization and prevention--a theoretical framework for environmental hygieneM Haider
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