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P J McMarr

Showing results (1-10 of 3) with videos related to

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Applied Optics|August 14, 2010
Roughness measurements of Si and Al by variable angle spectroscopic ellipsometryJ R Blanco, P J McMarr
Applied Optics|June 12, 2010
Measurement of the thickness of the surface layer on amorphous Ge films using spectroscopic ellipsometry: validity of effective medium modelingP J McMarr, J R Blanco
Applied Optics|November 15, 1985
Roughness measurements by spectroscopic ellipsometryJ R Blanco, P J McMarr, K Vedam
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Applied Optics|August 14, 2010
Roughness measurements of Si and Al by variable angle spectroscopic ellipsometryJ R Blanco, P J McMarr
Applied Optics|June 12, 2010
Measurement of the thickness of the surface layer on amorphous Ge films using spectroscopic ellipsometry: validity of effective medium modelingP J McMarr, J R Blanco
Applied Optics|November 15, 1985
Roughness measurements by spectroscopic ellipsometryJ R Blanco, P J McMarr, K Vedam
Pageof 1