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P Kükelhan

Showing results (1-10 of 5) with videos related to

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Ultramicroscopy|July 17, 2019
Composition determination for quaternary III-V semiconductors by aberration-corrected STEMP Kükelhan, T Hepp, S Firoozabadi, et al.
Ultramicroscopy|October 7, 2021
Optimization of imaging conditions for composition determination by annular dark field STEMS Firoozabadi, P Kükelhan, T Hepp, et al.
Ultramicroscopy|March 31, 2019
Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEMP Kükelhan, A Beyer, S Firoozabadi, et al.
Ultramicroscopy|June 20, 2022
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEMS Firoozabadi, P Kükelhan, A Beyer, et al.
Journal of Microscopy|September 30, 2017
Atomic structure of 'W'-type quantum well heterostructures investigated by aberration-corrected STEMP Kükelhan, A Beyer, C Fuchs, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|July 17, 2019
Composition determination for quaternary III-V semiconductors by aberration-corrected STEMP Kükelhan, T Hepp, S Firoozabadi, et al.
Ultramicroscopy|October 7, 2021
Optimization of imaging conditions for composition determination by annular dark field STEMS Firoozabadi, P Kükelhan, T Hepp, et al.
Ultramicroscopy|March 31, 2019
Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEMP Kükelhan, A Beyer, S Firoozabadi, et al.
Ultramicroscopy|June 20, 2022
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEMS Firoozabadi, P Kükelhan, A Beyer, et al.
Journal of Microscopy|September 30, 2017
Atomic structure of 'W'-type quantum well heterostructures investigated by aberration-corrected STEMP Kükelhan, A Beyer, C Fuchs, et al.
Pageof 1