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Materials (Basel, Switzerland)
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December 6, 2019
Impact of Line Edge Roughness on ReRAM Uniformity and Scaling
Vassilios Constantoudis, George Papavieros, Panagiotis Karakolis, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
October 13, 2015
Graphene-Modified Interface Controls Transition from VCM to ECM Switching Modes in Ta/TaOx Based Memristive Devices
Michael Lübben, Panagiotis Karakolis, Vassilios Ioannou-Sougleridis, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Materials (Basel, Switzerland)
|
December 6, 2019
Impact of Line Edge Roughness on ReRAM Uniformity and Scaling
Vassilios Constantoudis, George Papavieros, Panagiotis Karakolis, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
October 13, 2015
Graphene-Modified Interface Controls Transition from VCM to ECM Switching Modes in Ta/TaOx Based Memristive Devices
Michael Lübben, Panagiotis Karakolis, Vassilios Ioannou-Sougleridis, et al.
Page
of 1