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Applied Optics|July 14, 2009
Abel inversion of deflectometric data: comparison of accuracy and noise propagation of existing techniquesPankaj S Kolhe, Ajay K Agrawal
Applied Optics|August 7, 2007
Analytical estimation of solid angle subtended by complex well-resolved surfaces for infrared detection studiesShripad P Mahulikar, Santosh K Potnuru, Pankaj S Kolhe
Applied Optics|May 22, 2007
Miniature rainbow schlieren deflectometry system for quantitative measurements in microjets and flamesRajani P Satti, Pankaj S Kolhe, Semih Olcmen, et al.
Ultramicroscopy|December 2, 2014
Spectral analysis of the emission current noise exhibited by few layer WS2 nanosheets emitterSachin R Suryawanshi, Pankaj S Kolhe, Chandra S Rout, et al.
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