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Materials (Basel, Switzerland)|August 27, 2021
Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray DiffractionKien Nguyen, Ewen Bellec, Edoardo Zatterin, et al.Nature Nanotechnology|October 8, 2009
Catalyst preparation for CMOS-compatible silicon nanowire synthesisVincent T Renard, Michael Jublot, Patrice Gergaud, et al.Journal of Applied Crystallography|July 21, 2020
Impact and behavior of Sn during the Ni/GeSn solid-state reactionAndrea Quintero, Patrice Gergaud, Jean-Michel Hartmann, et al.Journal of Applied Crystallography|April 7, 2015
X-ray micro Laue diffraction tomography analysis of a solid oxide fuel cellDario Ferreira Sanchez, Julie Villanova, Jérôme Laurencin, et al.The Review of Scientific Instruments|June 3, 2009
A hard x-ray nanoprobe for scanning and projection nanotomographyPierre Bleuet, Peter Cloetens, Patrice Gergaud, et al.Nanoscale Research Letters|June 10, 2014
Improvement of the physical properties of ZnO/CdTe core-shell nanowire arrays by CdCl2 heat treatment for solar cellsVincent Consonni, Sébastien Renet, Jérôme Garnier, et al.Journal of Applied Crystallography|June 7, 2023
Study of GaN coalescence by dark-field X-ray microscopy at the nanoscaleMaya Wehbe, Matthew Charles, Kilian Baril, et al.Pageof 1