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Applied Optics|April 1, 2005
Nanometric position and displacement measurement of the six degrees of freedom by means of a patterned surface elementPatrick Sandoz
Medical Hypotheses|January 16, 2013
Does AIDS involve some collusion by the neuro-immune system because of positive learning of the disarmament strategy?Patrick Sandoz
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|December 24, 2011
Lensless vision system for in-plane positioning of a patterned plate with subpixel resolutionPatrick Sandoz, Maxime Jacquot
Applied Optics|September 13, 2002
High-accuracy position and orientation measurement of extended two-dimensional surfaces by a phase-sensitive vision methodPatrick Sandoz, Vincent Bonnans, Tijani Gharbi
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|December 4, 2012
Toward stereovisual monitoring of three-dimensional translations with submicrometer resolutionPatrick Sandoz, Imen Elhechmi, Tijani Gharbi
The Review of Scientific Instruments|June 21, 2007
In-plane rigid-body vibration mode characterization with a nanometer resolution by stroboscopic imaging of a microstructured patternPatrick Sandoz, Jean-Michel Friedt, Emile Carry
Sensors (Basel, Switzerland)|February 2, 2017
Performance Characterization of an xy-Stage Applied to Micrometric Laser Direct Writing LithographyJuan Jaramillo, Artur Zarzycki, July Galeano, et al.
Sensors (Basel, Switzerland)|June 23, 2018
Digital Holography as Computer Vision Position Sensor with an Extended Range of Working DistancesMiguel Asmad Vergara, Maxime Jacquot, Guillaume J Laurent, et al.
Skin Research and Technology : Official Journal of International Society for Bioengineering and the Skin (ISBS) [And] International Society for Digital Imaging of Skin (ISDIS) [And] International Society for Skin Imaging (ISSI)|November 13, 2004
Towards objective evaluation of the skin aspect: principles and instrumentationPatrick Sandoz, David Marsaut, Vincent Armbruster, et al.
Sensors (Basel, Switzerland)|March 15, 2014
Subpixelic measurement of large 1D displacements: principle, processing algorithms, performances and softwareValérian Guelpa, Guillaume J Laurent, Patrick Sandoz, et al.
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