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Applied Optics
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May 3, 2023
Measurement uncertainty of phase measuring deflectometry
Pavel Pavliček, Eva Paličková
Applied Optics
|
February 7, 2012
White-light interferometry on rough surfaces--measurement uncertainty caused by noise
Pavel Pavliček, Ondřej Hýbl
Applied Optics
|
December 25, 2019
Coherence scanning interferometry with a focus-tunable lens
Pavel Pavliček, Jonatan Kučera
Applied Optics
|
February 3, 2016
Shape from focus for large image fields
Pavel Pavliček, Ivana Hamarová
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of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
Applied Optics
|
May 3, 2023
Measurement uncertainty of phase measuring deflectometry
Pavel Pavliček, Eva Paličková
Applied Optics
|
February 7, 2012
White-light interferometry on rough surfaces--measurement uncertainty caused by noise
Pavel Pavliček, Ondřej Hýbl
Applied Optics
|
December 25, 2019
Coherence scanning interferometry with a focus-tunable lens
Pavel Pavliček, Jonatan Kučera
Applied Optics
|
February 3, 2016
Shape from focus for large image fields
Pavel Pavliček, Ivana Hamarová
Page
of 1