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Applied Optics|November 22, 2021
Absolute measurement method for a spherical surface by random off-axis rotation based on Zernike polynomialsPengfeng Sheng, Weicheng Gu, Jun YuOptics Express|November 25, 2018
In situ noncontact measurement system and two-step compensation strategy for ultra-precision diamond machiningJun Yu, Zhengxiang Shen, Xiaoqiang Wang, et al.Optics Express|November 11, 2025
Fabrication of electroless nickel coated X-ray ellipsoidal mirrors with hybrid metrology method combining CGH and contact profilometerPengfeng Sheng, Zhao Shi, Qiushi Huang, et al.Applied Optics|March 10, 2018
Ray tracing method for the evaluation of grazing incidence x-ray telescopes described by spatially sampled surfacesJun Yu, Zhengxiang Shen, Pengfeng Sheng, et al.Optics Express|May 9, 2023
Mixed stitching interferometry with correction from one-dimensional profile measurements for high-precision X-ray mirrorsQiaoyu Wu, Qiushi Huang, Jun Yu, et al.Pageof 1