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ACS Applied Energy Materials|May 17, 2024
Origins and Importance of Intragranular Cracking in Layered Lithium Transition Metal Oxide CathodesJędrzej K Morzy, Wesley M Dose, Per Erik Vullum, et al.ACS Applied Materials & Interfaces|August 12, 2025
Optically Programmable Smart WSe2/hBN Heterostructure Gas SensorsAyaz Ali, Prashant Bisht, Matthias Schrade, et al.ACS Applied Materials & Interfaces|December 1, 2015
Effect of Sb Segregation on Conductance and Catalytic Activity at Pt/Sb-Doped SnO2 Interface: A Synergetic Computational and Experimental StudyQiang Fu, Luis César Colmenares Rausseo, Umberto Martinez, et al.Scientific Reports|October 17, 2019
Silicon-Carbon composite anodes from industrial battery grade siliconHanne Flåten Andersen, Carl Erik Lie Foss, Jorunn Voje, et al.Small (Weinheim an Der Bergstrasse, Germany)|July 29, 2025
Mitigating Silicon Amorphization in Si-Gr Anodes: A Pathway to Stable, High-Energy Density Anodes for Li-Ion BatteriesPedro Alonso-Sánchez, Weicheng Hua, Kesavan Thangaian, et al.The Journal of Physical Chemistry Letters|February 21, 2025
Revisiting Mechanism of Silicon Degradation in Li-Ion Batteries: Effect of Delithiation Examined by Microscopy Combined with ReaxFFCarl Erik L Foss, Mahdi K Talkhoncheh, Asbjørn Ulvestad, et al.Nano Letters|April 16, 2021
Observation of Electric-Field-Induced Structural Dislocations in a Ferroelectric OxideDonald M Evans, Didrik René Småbråten, Theodor S Holstad, et al.Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|September 18, 2025
Local p- and n-Type Doping of an Oxide Semiconductor via Electric-Field-Driven Defect MigrationJiali He, Ursula Ludacka, Kasper A Hunnestad, et al.Advanced Materials (Deerfield Beach, Fla.)|May 19, 2025
Uni-Axial Densification of Slurry-Casted Li₆PS₅Cl Tapes: The Role of Particle Size Distribution and Densification PressureQuoc-Anh Tran, Meenal Agrawal, Michael Häusler, et al.Nature Materials|September 15, 2020
Publisher Correction: Conductivity control via minimally invasive anti-Frenkel defects in a functional oxideDonald M Evans, Theodor S Holstad, Aleksander B Mosberg, et al.Pageof 4