Peter J Konijnenberg - JoVE Visualize

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The Review of Scientific Instruments|February 6, 2008

Polarization microscopy probe for applications in a high magnetic fieldPeter J Konijnenberg, Arndt Ziemons, Dmitri A Molodov, et al.

The Review of Scientific Instruments|October 1, 2022

Development of a new, fully automated system for electron backscatter diffraction (EBSD)-based large volume three-dimensional microstructure mapping using serial sectioning by mechanical polishing, and its application to the analysis of special boundaries in 316L stainless steelShao-Pu Tsai, Peter J Konijnenberg, Ivan Gonzalez, et al.

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Showing results (1-10 of 2) with videos related to

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The Review of Scientific Instruments|February 6, 2008

Polarization microscopy probe for applications in a high magnetic fieldPeter J Konijnenberg, Arndt Ziemons, Dmitri A Molodov, et al.

The Review of Scientific Instruments|October 1, 2022

Development of a new, fully automated system for electron backscatter diffraction (EBSD)-based large volume three-dimensional microstructure mapping using serial sectioning by mechanical polishing, and its application to the analysis of special boundaries in 316L stainless steelShao-Pu Tsai, Peter J Konijnenberg, Ivan Gonzalez, et al.

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