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Micron (Oxford, England : 1993)
|
August 20, 2024
Characterization of extended defects in 2D materials using aperture-based dark-field STEM in SEM
Peter Denninger, Peter Schweizer, Erdmann Spiecker
Science Advances
|
August 15, 2018
In situ manipulation and switching of dislocations in bilayer graphene
Peter Schweizer, Christian Dolle, Erdmann Spiecker
Ultramicroscopy
|
April 12, 2020
Low energy nano diffraction (LEND) - A versatile diffraction technique in SEM
Peter Schweizer, Peter Denninger, Christian Dolle, et al.
Nanoscale
|
June 11, 2019
Transforming layered MoS<sub>2</sub> into functional MoO<sub>2</sub> nanowires
Lilian M Vogl, Peter Schweizer, Mingjian Wu, et al.
Nature Communications
|
June 16, 2026
Staging and defect-limited intercalation of FeCl<sub>3</sub> in graphite electrodes
Peter Schweizer, Lilian M Vogl, Colin Ophus, et al.
ACS Nano
|
October 25, 2022
Sensing Capabilities of Single Nanowires Studied with Correlative <i>In Situ</i> Light and Electron Microscopy
Lilian M Vogl, Peter Schweizer, Peter Denninger, et al.
Nanoscale
|
May 10, 2023
From metal nanowires to ultrathin crystalline ALD nanotubes: process development and mechanism revealed by <i>in situ</i> TEM heating experiments
Lilian Maria Vogl, Peter Schweizer, Laszlo Pethö, et al.
Materials Today. Bio
|
June 3, 2022
The response of soft tissue cells to Ti implants is modulated by blood-implant interactions
William A Lackington, Lada Fleyshman, Peter Schweizer, et al.
Nature Communications
|
April 10, 2020
Mechanical cleaning of graphene using in situ electron microscopy
Peter Schweizer, Christian Dolle, Daniela Dasler, et al.
ACS Nano
|
October 16, 2024
Unraveling Interdiffusion Phenomena and the Role of Nanoscale Diffusion Barriers in the Copper-Gold System
Lilian M Vogl, Peter Schweizer, Xavier Maeder, et al.
Page
of 3
Search research articles
Search
Showing results (1-10 of 29) with videos related to
Sort By:
Page
of 3
Micron (Oxford, England : 1993)
|
August 20, 2024
Characterization of extended defects in 2D materials using aperture-based dark-field STEM in SEM
Peter Denninger, Peter Schweizer, Erdmann Spiecker
Science Advances
|
August 15, 2018
In situ manipulation and switching of dislocations in bilayer graphene
Peter Schweizer, Christian Dolle, Erdmann Spiecker
Ultramicroscopy
|
April 12, 2020
Low energy nano diffraction (LEND) - A versatile diffraction technique in SEM
Peter Schweizer, Peter Denninger, Christian Dolle, et al.
Nanoscale
|
June 11, 2019
Transforming layered MoS<sub>2</sub> into functional MoO<sub>2</sub> nanowires
Lilian M Vogl, Peter Schweizer, Mingjian Wu, et al.
Nature Communications
|
June 16, 2026
Staging and defect-limited intercalation of FeCl<sub>3</sub> in graphite electrodes
Peter Schweizer, Lilian M Vogl, Colin Ophus, et al.
ACS Nano
|
October 25, 2022
Sensing Capabilities of Single Nanowires Studied with Correlative <i>In Situ</i> Light and Electron Microscopy
Lilian M Vogl, Peter Schweizer, Peter Denninger, et al.
Nanoscale
|
May 10, 2023
From metal nanowires to ultrathin crystalline ALD nanotubes: process development and mechanism revealed by <i>in situ</i> TEM heating experiments
Lilian Maria Vogl, Peter Schweizer, Laszlo Pethö, et al.
Materials Today. Bio
|
June 3, 2022
The response of soft tissue cells to Ti implants is modulated by blood-implant interactions
William A Lackington, Lada Fleyshman, Peter Schweizer, et al.
Nature Communications
|
April 10, 2020
Mechanical cleaning of graphene using in situ electron microscopy
Peter Schweizer, Christian Dolle, Daniela Dasler, et al.
ACS Nano
|
October 16, 2024
Unraveling Interdiffusion Phenomena and the Role of Nanoscale Diffusion Barriers in the Copper-Gold System
Lilian M Vogl, Peter Schweizer, Xavier Maeder, et al.
Page
of 3