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The Journal of Chemical Physics|July 25, 2023
mmodel: A workflow framework to accelerate the development of experimental simulationsPeter Sun, John A MarohnJournal of Magnetic Resonance (San Diego, Calif. : 1997)|August 25, 2023
The Landau-Zener-Stückelberg-Majorana transition in the T<sub>2</sub> ≪ T<sub>1</sub> limitMichael C Boucher, Peter Sun, Ivan Keresztes, et al.ACS Nano|January 10, 2023
A Non-Perturbative, Low-Noise Surface Coating for Sensitive Force-Gradient Detection of Electron Spin Resonance in Thin FilmsMichael C Boucher, Corinne E Isaac, Peter Sun, et al.The Journal of Chemical Physics|June 9, 2026
mrfmsim: A modular, extendable, and readable simulation package for magnetic resonance force microscopy experimentsPeter Sun, Corinne E Isaac, Michael C Boucher, et al.Physical Review Letters|September 28, 2004
Microscopic view of charge injection in an organic semiconductorWilliam R Silveira, John A MarohnThe Journal of Chemical Physics|December 11, 2013
Electric force microscopy of semiconductors: theory of cantilever frequency fluctuations and noncontact frictionSwapna Lekkala, John A Marohn, Roger F LoringPhysical Review Letters|May 23, 2006
Dielectric fluctuations and the origins of noncontact frictionSeppe Kuehn, Roger F Loring, John A MarohnThe Journal of Physical Chemistry. B|June 23, 2007
Time-resolved electric force microscopy of charge trapping in polycrystalline pentaceneMichael Jaquith, Erik M Muller, John A MarohnPhysical Review. B, Condensed Matter and Materials Physics|February 14, 2014
A Unified Picture of Cantilever Frequency-Shift Measurements of Magnetic ResonanceSanggap Lee, Eric W Moore, John A MarohnScience Advances|July 11, 2017
Microsecond photocapacitance transients observed using a charged microcantilever as a gated mechanical integratorRyan P Dwyer, Sarah R Nathan, John A MarohnPageof 8